Fundamental investigations on interface magnetism
Our group works on the preparation of magnetic thin films and multilayers by magnetron sputtering for applications as exchange biased spin valves and neutron spin polarizer super mirrors. The layer profile and the interface properties of the thin films and multilayers are characterized by specular and off-specular X-ray reflectivity. Structural characterization is performed by X-ray diffraction.
The magnetic properties of these films and their temperature dependence are investigated by a number of different methods. Layer resolved magnetization profiles are obtained by specular polarized neutron reflectometry, lateral magnetic correlations, domains etc, by off-specular polarized neutron reflectometry. The magnetic domain structure is determined by magnetic force microscopy.
Fundamental studies address details of the interface magnetism, exchange bias, spin valves, interlayer exchange coupling, magnetization reversal, anisotropic properties, as well as magneto-transport properties, in view of applications of these materials in spintronics.